Download Materials Science in Microelectronics II. The Effects of by E.S. Machlin (Auth.) PDF

By E.S. Machlin (Auth.)

Content material:
Acknowledgement

, Page xi
Chapter I - electric Properties

, Pages 1-56
Chapter II - Magnetic Properties

, Pages 57-102
Chapter III - Optical Properties

, Pages 103-134
Chapter IV - Mechanical Properties

, Pages 135-168
Chapter V - Mass delivery Properties

, Pages 169-187
Chapter VI - Interface and Junction Properties

, Pages 189-214
Chapter VII - Defects and Properties

, Pages 215-250
Index

, Pages 251-255

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Extra info for Materials Science in Microelectronics II. The Effects of Structure on Properties in Thin Films

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Stanley, in 23rd IEEE Photovoltaic Specialists Conference, 1993, p. 422. 58. O. Kolbesen, W. Bergholz, H. Cerva, F. Gelsdorf, H. Wendt and G. Zoth, in Structure and Properties of Dislocations in Semiconductors, eds. G. B. R. Wilshaw, IOP Conference Series 104, IOP, Bristol, 1989, p. 421. 52 I-Electrical Properties 59. R. Labusch and J. Hess, in Point and Extended Defects in Semiconductors, eds. G. Benedek, A. Cavallini and W. Schröter, NATO ASI Series B, Physics, 202, Plenum Press, New York, 1988, p.

Street, in Hydrogenated Amorphous Silicon, Cambridge University Press, Cambridge, UK, 1991, p. 311. 29. L. Kazmerski, in Polycrystalline Semiconductors, Grain Boundaries and Interfaces, eds. J. P. H. Werner, Springer-Verlag, Berlin, 1989, p. 96. 30. P. Sutton, in Structure and Properties of Dislocations in Semiconductors, eds. G. B. R. Wilshaw, IOP Conference Series 104, IOP, Bristol, 1989, p. 13. 31. L. H. Bube, in Fundamentals of Solar Cells, Academic Press, New York, 1983, p. 364. 32. M. Kohyama, S.

Albin and R. , 415. 39. R. Noufi, R. Axton, C. K. Deb, Appl. Phys. Lett. 45, 668(1984). 40. M. Günes, H. M. R. Wronski, IEEE 1st WCPEC, 1994, p. 512. 41. Ref. [31], p. 57. 42. A. Street, Phil. Mag. B49, L15(1984). 43. M. R. J. McMahon, J. Appl. Phys. 76, 2260(1994). 44. Ref. [28], p. 278. 45. It was reported at the 1996 MRS Spring meeting that S. , have made electron paramagnetic resonance measurements that show that carbon and oxygen are not the cause of the Staebler–Wronski effect. See p. 70 of MRS Bull.

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