By Seizo Morita
Scanning tunneling microscopy - with its purposes that span not just atomic solution but additionally scanning tunneling spectroscopy, atom/molecule manipulation and nanostructuring, and inelastic electron tunneling spectroscopy - has completed notable development and develop into the major expertise for floor technology. along with, atomic strength microscopy can also be speedily constructing and attaining outstanding development and accomplishments resembling precise atomic answer, atom/molecule identity, manipulation and nanostructuring. This ebook that predicts the long run improvement for all of scanning probe microscopy (SPM). Such forecasts will help to figure out the path eventually to be taken and to speed up study and improvement on nanotechnology and nanoscience, in addition to all SPM-related fields in destiny.
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Additional info for Roadmap of Scanning Probe Microscopy
Swartzentruber, Phys. Rev. Lett. H. , J. Microsc. 152, 325 (1988) B. K. Gimzewski, Surf. Sci. T. Tsong, Atom-probe ﬁeld ion microscopy (Cambridge University Press, 1990) S. Heike, T. Hashizume, Y. Wada, J. Vac. Sci. Technol. B 14, 1522 (1986) M. , Surf. Sci. 355, 21 (1996) T. Arai, M. Tomitori, Appl. Phys. 1 Principle Atomic force microscopy (AFM)  is a novel technique for high resolution imaging of conducting as well as nonconducting surfaces. As shown in Fig. 1, the physical property sensed in AFM is the interaction force between the sample surface and a sharp probing tip.
Eng. 73-74, 910 (2004) 11. A. Asenov, Nanotechnology 10, 153 (1999) 6 Electrostatic Force Microscopy Masakazu Nakamura and Hirofumi Yamada Electrostatic force microscopy (EFM) is one of the SPM families which can visualize the distribution of electric potential, charge, contact potential diﬀerence etc. by detecting the electrostatic force between a probe and a sample. The ﬁrst trial of the detection of electrostatic force is done by Martin et al. , and the observation of surface charges on polymer ﬁlms was carried out by Stern and coworkers [2, 3] which is thought to be the original work leading up to the current EFM technique.
J. , Appl. Phys. Lett. 71, 1546 (1997) ´ 10. D. , Microelectron. Eng. 73-74, 910 (2004) 11. A. Asenov, Nanotechnology 10, 153 (1999) 6 Electrostatic Force Microscopy Masakazu Nakamura and Hirofumi Yamada Electrostatic force microscopy (EFM) is one of the SPM families which can visualize the distribution of electric potential, charge, contact potential diﬀerence etc. by detecting the electrostatic force between a probe and a sample. The ﬁrst trial of the detection of electrostatic force is done by Martin et al.